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Product Sales record V.S Measuring demonstration TOMAS AE100 3D Nanoscan
TOMAS AE100 3D Nanoscan

Nano Accuracy and Speed
AN 3D Nanoscan
1. Nano Depth 3D Detection
2. High-speed/contactless measurement
3. Surface shape/roughness analysis
4. Non-transparent/transparent materials are suitable
5. Safety measurement of non-electron beam/non-laser
6. Low maintenance costs
Nano-precision: traceability measurement and analysis in pursuit of original reproduction
Nano3D micromorphology is presented quickly, and the patented technology of phase-shift vertical scanning enables depth resolution of 0.1 nm

TOMAS, 2.5D, 3D, CMM, Measurement, Instruments, Microscopes, image measuring instrument, semi-automatic >

 
 
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